Surface characterization of microtextured silicone.

Abstract

A set of microtextured silicone surfaces was manufactured using the technique of photolithography. The textures consist of a uniform array that imparts anisotropy to the surfaces. Processing the material required multiple steps which may have altered the surface characteristics. This project aimed to determine if a surface texture on implant grade silicone would affect the material characteristics. ESCA and contact angle studies revealed no measurable alteration of the surface chemistry or surface energy due to the texturing procedure or the presence of the texture. Both analytical techniques confirmed the material was silicone. The actual dimensions of the surface textures, size, spacing, depth and orientation of the textures were found to be close to the design values, using SEM and quantitative two- and three-dimensional profilometry. Standard 2D profilometry was not sufficient to characterize the surfaces, as a direct result of the uniformity of the arrays. A method of characterizing regular surface periodic structures is presented.