Imaging electromigration during the formation of break junctions.
basic_science · Level V
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Abstract
Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.