Subdiffraction far-field imaging of luminescent single-walled carbon nanotubes.

Cognet, Laurent; Tsyboulski, Dmitri A; Weisman, R Bruce · Nano Lett · 2008

basic_science · Level V

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Abstract

Far-field near-infrared fluorescence microscopy of single-walled carbon nanotubes (SWNTs) has been hampered by the diffraction limit to resolution. A new analysis method is presented that allows subwavelength (<lambda/10) mapping of single-molecule chemical reaction sites on semiconducting SWNTs, enabling precise localization of excitonic luminescence regions along the nanotube axis through a nonperturbing, far-field optical measurement. This method is applied to reveal the subdiffraction lengths, curvatures, and defects of luminescent SWNTs in unprecedented detail.

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