Statistical texture characterization from discrete wavelet representations.

Van de Wouwer, G; Scheunders, P; Van Dyck, D · IEEE Trans Image Process · 1999

basic_science · Level V

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Abstract

We conjecture that texture can be characterized by the statistics of the wavelet detail coefficients and therefore introduce two feature sets: (1) the wavelet histogram signatures which capture all first order statistics using a model based approach and (2) the wavelet co-occurrence signatures, which reflect the coefficients' second-order statistics. The introduced feature sets outperform the traditionally used energy. Best performance is achieved by combining histogram and co-occurrence signatures.