Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies.
other · Level V
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- Record sourced from PubMed, PMID 19640001.
- Also identified by DOI 10.1021/nl9014342.
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Abstract
A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.
Medical subject headings
- Luminescent Measurements
- Microscopy, Atomic Force
- Nanotechnology
- Nanotubes, Carbon