Sub-20 nm Si/Ge superlattice nanowires by metal-assisted etching.

Geyer, Nadine; Huang, Zhipeng; Fuhrmann, Bodo; Grimm, Silko; Reiche, Manfred; Nguyen-Duc, Trung-Kien; de Boor, Johannes; Leipner, Hartmut S et al. · Nano Lett · 2009

basic_science · Level V

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Abstract

An effective and low-cost method to fabricate hexagonally patterned, vertically aligned Si/Ge superlattice nanowires with diameters below 20 nm is presented. By combining the growth of Si/Ge superlattices by molecular beam epitaxy, prepatterning the substrate by anodic aluminum oxide masks, and finally metal-assisted chemical wet etching, this method generates highly ordered hexagonally patterned nanowires. This technique allows the fabrication of nanowires with a high area density of 10(10) wires/cm(2), including the control of their diameter and length.

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