Tuning the graphene work function by electric field effect.
basic_science · Level V
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- Record sourced from PubMed, PMID 19719145.
- Also identified by DOI 10.1021/nl901572a.
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Abstract
We report variation of the work function for single and bilayer graphene devices measured by scanning Kelvin probe microscopy (SKPM). By use of the electric field effect, the work function of graphene can be adjusted as the gate voltage tunes the Fermi level across the charge neutrality point. Upon biasing the device, the surface potential map obtained by SKPM provides a reliable way to measure the contact resistance of individual electrodes contacting graphene.