Patterning microfluidic device wettability using flow confinement.
basic_science · Level V
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- Record sourced from PubMed, PMID 20490412.
- Also identified by DOI 10.1039/c004124f.
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Abstract
We present a simple method to spatially pattern the surface properties of microfluidic devices using flow confinement. Our technique allows surface patterning with micron-scale resolution. To demonstrate its effectiveness, we use it to pattern wettability to form W/O/W and O/W/O double emulsions.