Charge Writing at the LaAlO3/SrTiO3 surface.

Xie, Yanwu; Bell, Christopher; Yajima, Takeaki; Hikita, Yasuyuki; Hwang, Harold Y · Nano Lett · 2010

basic_science · Level V

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Abstract

Biased conducting-tip atomic force microscopy (AFM) has been shown to write and erase nanoscale metallic lines at the LaAlO(3)/SrTiO(3) interface. Using various AFM modes, we show the mechanism of conductivity switching is the writing of surface charge. These charges are stably deposited on a wide range of LaAlO(3) thicknesses, including bulk crystals. A strong asymmetry with writing polarity was found for 1 and 2 unit cells of LaAlO(3), providing experimental evidence for a theoretically predicted built-in potential.