Probing strain-induced electronic structure change in graphene by Raman spectroscopy.
basic_science · Level V
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- Record sourced from PubMed, PMID 20735024.
- Also identified by DOI 10.1021/nl102123c.
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Abstract
Two-phonon Raman scattering in graphitic materials provides a distinctive approach to probing the material's electronic structure through the spectroscopy of phonons. Here we report studies of Raman scattering of the two-dimensional mode of single-layer graphene under uniaxial stress and which implicates two types of modification of the low-energy electronic structure of graphene: a deformation of the Dirac cone and its displacement away from the K point.