Standardless atom counting in scanning transmission electron microscopy.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 20945926.
- Also identified by DOI 10.1021/nl102025s.
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Abstract
We demonstrate that high-angle annular dark-field imaging in scanning transmission electron microscopy allows for quantification of the number and location of all atoms in a three-dimensional, crystalline, arbitrarily shaped specimen without the need for a calibration standard. We show that the method also provides for an approach to directly measure the finite effective source size of a scanning transmission electron microscope.
Medical subject headings
- Algorithms
- Image Interpretation, Computer-Assisted
- Microscopy, Electron, Scanning Transmission