A model of waveform reliability in facial nerve electroneurography.

Abstract

This study identifies four factors that should be considered when evaluating the reliability of new testing methods in facial nerve electroneurography (ENOG): (1) waveform peak-to-peak amplitude; (2) response variability; (3) statistical significance of day-to-day test/retest differences; and (4) waveform morphology. These factors were applied to data gathered on seven normal subjects who had three trials of facial-nerve ENOG on three separate test days in order to determine an optimal recording electrode montage. Both bipolar and monopolar recording-electrode montages were used on the nasal alae and on the nasolabial crease. Resultant peak-to-peak amplitudes of combined motor action potentials were recorded and measured using a clinical evoked-potential instrument. A biphasic waveform shape with optimal peak-to-peak point rather than the nasolabial crease. The contribution to the assessment of response reliability of each of the four factors is discussed.