Spectroscopic characterization of charged defects in polycrystalline pentacene by time- and wavelength-resolved electric force microscopy.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 21274909.
- Also identified by DOI 10.1002/adma.201003073.
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Abstract
Spatial maps of topography and trapped charge are acquired for polycrystalline pentacene thin-film transistors using electric and atomic force microscopy. In regions of trapped charge, the rate of trap clearing is studied as a function of the wavelength of incident radiation.
Medical subject headings
- Microscopy
- Naphthacenes
- Spectrum Analysis
- Transistors, Electronic