Mapping of local electrical properties in epitaxial graphene using electrostatic force microscopy.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 21526826.
- Also identified by DOI 10.1021/nl200581g.
- No licence information is recorded for this record.
- Because redistribution is not established, this page shows the abstract only. Follow the links below for the full text.
Abstract
Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using electrostatic force microscopy (EFM) in ambient conditions and at elevated temperatures is presented. EFM provides a straightforward identification of graphene with different numbers of layers on the substrate where topographical determination is hindered by adsorbates. Novel EFM spectroscopy has been developed measuring the EFM phase as a function of the electrical DC bias, establishing a rigorous way to distinguish graphene domains and facilitating optimization of EFM imaging.
Medical subject headings
- Electrons
- Graphite