Anatomy of a nanoscale conduction channel reveals the mechanism of a high-performance memristor.

Miao, Feng; Strachan, John Paul; Yang, J Joshua; Zhang, Min-Xian; Goldfarb, Ilan; Torrezan, Antonio C; Eschbach, Peter; Kelley, Ronald D et al. · Adv Mater · 2011

basic_science · Level V

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Abstract

By employing a precise method for locating and directly imaging the active switching region in a resistive random access memory (RRAM) device, a nanoscale conducting channel consisting of an amorphous Ta(O) solid solution surrounded by nearly stoichiometric Ta(2) O(5) is observed. Structural and chemical analysis of the channel combined with temperature-dependent transport measurements indicate a unique resistance switching mechanism.

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