Real-time observation on dynamic growth/dissolution of conductive filaments in oxide-electrolyte-based ReRAM.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 22407902.
- Also identified by DOI 10.1002/adma.201104104.
- No licence information is recorded for this record.
- Because redistribution is not established, this page shows the abstract only. Follow the links below for the full text.
Abstract
Evolution of growth/dissolution conductive filaments (CFs) in oxide-electrolyte-based resistive switching memories are studied by in situ transmission electron microscopy. Contrary to what is commonly believed, CFs are found to start growing from the anode (Ag or Cu) rather than having to reach the cathode (Pt) and grow backwards. A new mechanism based on local redox reactions inside the oxide-electrolyte is proposed.
Medical subject headings
- Electrolytes
- Oxides
- Semiconductors