Direct imaging of single Au atoms within GaAs nanowires.

Bar-Sadan, Maya; Barthel, Juri; Shtrikman, Hadas; Houben, Lothar · Nano Lett · 2012

basic_science · Level V

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Abstract

Incorporation of catalyst atoms during the growth process of semiconductor nanowires reduces the electron mean free path and degrades their electronic properties. Aberration-corrected scanning transmission electron microscopy (STEM) is now capable of directly imaging single Au atoms within the dense matrix of a GaAs crystal, by slightly tilting the GaAs lattice planes with respect to the incident electron beam. Au doping values in the order of 10(17-18) cm(3) were measured, making ballistic transport through the nanowires practically inaccessible.