Thermally induced parametric instability in a back-action evading measurement of a micromechanical quadrature near the zero-point level.

Suh, J; Shaw, M D; Leduc, H G; Weinstein, A J; Schwab, K C · Nano Lett · 2012

basic_science · Level V

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Abstract

We report the results of back-action evading experiments utilizing a tightly coupled electro-mechanical system formed by a radio frequency micromechanical resonator parametrically coupled to a NbTiN superconducting microwave resonator. Due to excess dissipation in the microwave resonator, we observe a parametric instability induced by a thermal shift of the mechanical resonance frequency. In light of these measurements, we discuss the constraints on microwave dissipation needed to perform BAE measurements far below the zero-point level.