Ion-irradiation-induced defects in isotopically-labeled two layered graphene: enhanced in-situ annealing of the damage.
basic_science · Level V
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- Record sourced from PubMed, PMID 23180424.
- Also identified by DOI 10.1002/adma.201203807.
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Abstract
Contrary to theoretical estimates based on the conventional binary collision model, experimental results indicate that the number of defects in the lower layer of the bi-layer graphene sample is smaller than in the upper layer. This observation is explained by in situ self-annealing of the defects.
Medical subject headings
- Graphite