Mapping impurity of single-walled carbon nanotubes in bulk samples with multiplex coherent anti-stokes Raman microscopy.

Duarte, Alex S; Rehbinder, Jean; Correia, Ricardo R B; Buckup, Tiago; Motzkus, Marcus · Nano Lett · 2013

basic_science · Level V

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Abstract

Mapping of defects in bulk samples of single-walled carbon nanotubes (SWNT) is performed via multiplex coherent anti-Stokes Raman microscopy. The D and G vibrational bands are acquired simultaneously, and their relative amplitude is used as a criterion to quantify the local purity in spin-coated SWNT samples. We observe that defects induced by oxidation are related to the spatial dispersion of nanotubes in a solid distribution.