Mapping impurity of single-walled carbon nanotubes in bulk samples with multiplex coherent anti-stokes Raman microscopy.
basic_science · Level V
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- Record sourced from PubMed, PMID 23323766.
- Also identified by DOI 10.1021/nl304371x.
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Abstract
Mapping of defects in bulk samples of single-walled carbon nanotubes (SWNT) is performed via multiplex coherent anti-Stokes Raman microscopy. The D and G vibrational bands are acquired simultaneously, and their relative amplitude is used as a criterion to quantify the local purity in spin-coated SWNT samples. We observe that defects induced by oxidation are related to the spatial dispersion of nanotubes in a solid distribution.