Structural and optoelectronic characterization of RF sputtered ZnSnN(2).
basic_science · Level V
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- Record sourced from PubMed, PMID 23386387.
- Also identified by DOI 10.1002/adma.201204718.
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Abstract
ZnSnN(2), a new earth-abundant semiconductor, is synthesized and characterized for use as a photovoltaic absorber material. Results confirm the predicted orthorhombic Pna2(1) crystal structure in RF sputtered thin films. Additionally, optical measurements reveal a direct bandgap of about 2 eV, which is larger than our calculated bandgap of 1.42 eV due to the Burstein-Moss effect.