Single defect center scanning near-field optical microscopy on graphene.

Tisler, Julia; Oeckinghaus, Thomas; Stöhr, Rainer J; Kolesov, Roman; Reuter, Rolf; Reinhard, Friedemann; Wrachtrup, Jörg · Nano Lett · 2013

basic_science · Level V

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Abstract

We present a scanning-probe microscope based on an atomic-size emitter, a single nitrogen-vacancy center in a nanodiamond. We employ this tool to quantitatively map the near-field coupling between the NV center and a flake of graphene in three dimensions with nanoscale resolution. Further we demonstrate universal energy transfer distance scaling between a point-like atomic emitter and a two-dimensional acceptor. Our study paves the way toward a versatile single emitter scanning microscope, which could image and excite molecular-scale light fields in photonic nanostructures or single fluorescent molecules.

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