A general approach for fast detection of charge carrier type and conductivity difference in nanoscale materials.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 24123236.
- Also identified by DOI 10.1002/adma.201302941.
- No licence information is recorded for this record.
- Because redistribution is not established, this page shows the abstract only. Follow the links below for the full text.
Abstract
A general method using a biased atomic force microscopy tip that allows a qualitative, fast, and reliable determination of key electronic properties such as metallic, n-, or p-doped characteristics has been reported for the first time. This method eliminates the detrimental effect of contact in the traditional transport measurement and is much simpler than the common-electrostatic force microscopy detection method, thus providing a powerful tool for fast characterizations of nanomaterials.