Spectroscopic proof of the correlation between redox-state and charge-carrier transport at the interface of resistively switching Ti/PCMO devices.

Herpers, Anja; Lenser, Christian; Park, Chanwoo; Offi, Francesco; Borgatti, Francesco; Panaccione, Giancarlo; Menzel, Stephan; Waser, Rainer et al. · Adv Mater · 2014

basic_science · Level V

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Also identified by DOI 10.1002/adma.201304054.
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Abstract

By using hard X-ray photoelectron spectroscopy experimentally, proof is provided that resistive switching in Ti/Pr₀.₄₈ Ca₀.₅₂ MnO₃ (PCMO) devices is based on a redox-process that mainly occurs on the Ti-side. The different resistance states are determined by the amount of fully oxidized Ti-ions in the stack, implying a reversible redox-reaction at the interface, which governs the formation and shortening of an insulating tunnel barrier.

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