Element specific monolayer depth profiling.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 25103570.
- Also identified by DOI 10.1002/adma.201402028.
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Abstract
The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers.
Medical subject headings
- Nanostructures
- Spectrum Analysis