Elemental fingerprinting of materials with sensitivity at the atomic limit.
basic_science · Level V
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- Record sourced from PubMed, PMID 25275823.
- Also identified by DOI 10.1021/nl5030613.
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Abstract
By using synchrotron X-rays as a probe and a nanofabricated smart tip of a tunneling microscope as a detector, we have achieved chemical fingerprinting of individual nickel clusters on a Cu(111) surface at 2 nm lateral resolution, and at the ultimate single-atomic height sensitivity. Moreover, by varying the photon energy, we have succeeded to locally measure photoionization cross sections of just a single Ni nanocluster, which opens new exciting opportunities for chemical imaging of nanoscale materials.