Ultrastructurally smooth thick partitioning and volume stitching for large-scale connectomics.
basic_science · Level V
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- Record sourced from PubMed, PMID 25686390.
- Also identified by DOI 10.1038/nmeth.3292 and PMC identifier 4382383.
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Abstract
Focused-ion-beam scanning electron microscopy (FIB-SEM) has become an essential tool for studying neural tissue at resolutions below 10 nm × 10 nm × 10 nm, producing data sets optimized for automatic connectome tracing. We present a technical advance, ultrathick sectioning, which reliably subdivides embedded tissue samples into chunks (20 μm thick) optimally sized and mounted for efficient, parallel FIB-SEM imaging. These chunks are imaged separately and then 'volume stitched' back together, producing a final three-dimensional data set suitable for connectome tracing.
Medical subject headings
- Connectome
- Imaging, Three-Dimensional
- Microscopy, Electron, Scanning