Visualizing Optoelectronic Processes at the Nanoscale.
basic_science · Level V
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- Record sourced from PubMed, PMID 26524228.
- Also identified by DOI 10.1021/acsnano.5b06282.
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Abstract
In this issue of ACS Nano, Nienhaus et al. report the optoelectronic properties of carbon nanotube chiral junctions with nanometer resolution in the presence of strong electric fields (∼1 V/nm). Here, we provide an overview of recent studies that combine scanning tunneling microscope (STM) and laser or microwave illumination. These techniques reveal nanoscale laser- or microwave-induced phenomena utilizing the intrinsic atomic resolution of the tunneling current, and do not require substantial modification of the STM itself. The merits of atomic-scale spatial resolution and chemical sensitivity of the laser or microwave spectroscopes make these techniques useful for nanoscale characterization.