Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy.

Bose, Riya; Sun, Jingya; Khan, Jafar I; Shaheen, Basamat S; Adhikari, Aniruddha; Ng, Tien Khee; Burlakov, Victor M; Parida, Manas R et al. · Adv Mater · 2016

basic_science · Level V

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Abstract

A breakthrough in the development of 4D scanning ultrafast electron microscopy is described for real-time and space imaging of secondary electron energy loss and carrier diffusion on the surface of an array of nanowires as a model system, providing access to a territory that is beyond the reach of either static electron imaging or any time-resolved laser spectroscopy.