Electrochemical Control of Copper Intercalation into Nanoscale Bi<sub>2</sub>Se<sub>3</sub>.
basic_science · Level V
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- Record sourced from PubMed, PMID 28218538.
- Also identified by DOI 10.1021/acs.nanolett.6b05062.
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Abstract
Intercalation of exotic atoms or molecules into the layered materials remains an extensively investigated subject in current physics and chemistry. However, traditionally melt-growth and chemical interaction strategies are either limited by insufficiency of intercalant concentrations or destitute of accurate controllability. Here, we have developed a general electrochemical intercalation method to efficaciously regulate the concentration of zerovalent copper atoms into layered Bi<sub>2</sub>Se<sub>3</sub>, followed by comprehensive experimental characterization and analyses. Up to 57% copper atoms (Cu<sub>6.7</sub>Bi<sub>2</sub>Se<sub>3</sub>) can be intercalated with no disruption to the host lattice. Meanwhile the unconventional resistance dip accompanied by a hysteresis loop below 40 K, as well as the emergence of new Raman peak in Cu<sub>x</sub>Bi<sub>2</sub>Se<sub>3</sub>, is a distinct manifestation of the interplay between intercalated Cu atoms with Bi<sub>2</sub>Se<sub>3</sub> host. Our work demonstrates a new methodology to study fundamentally new and unexpected physical behaviors in intercalated metastable materials.