Low-Temperature Ohmic Contact to Monolayer MoS<sub>2</sub> by van der Waals Bonded Co/h-BN Electrodes.
basic_science · Level V
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- Record sourced from PubMed, PMID 28691487.
- Also identified by DOI 10.1021/acs.nanolett.7b01536.
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Abstract
Monolayer MoS<sub>2</sub>, among many other transition metal dichalcogenides, holds great promise for future applications in nanoelectronics and optoelectronics due to its ultrathin nature, flexibility, sizable band gap, and unique spin-valley coupled physics. However, careful study of these properties at low temperature has been hindered by an inability to achieve low-temperature Ohmic contacts to monolayer MoS<sub>2</sub>, particularly at low carrier densities. In this work, we report a new contact scheme that utilizes cobalt (Co) with a monolayer of hexagonal boron nitride (h-BN) that has the following two functions: modifies the work function of Co and acts as a tunneling barrier. We measure a flat-band Schottky barrier of 16 meV, which makes thin tunnel barriers upon doping the channels, and thus achieve low-T contact resistance of 3 kΩ.μm at a carrier density of 5.3 × 10<sup>12</sup>/cm<sup>2</sup>. This further allows us to observe Shubnikov-de Haas oscillations in monolayer MoS<sub>2</sub> at much lower carrier densities compared to previous work.