Network characteristics and patent value-Evidence from the Light-Emitting Diode industry.

Abstract

This study proposes a different angle to social network analysis that evaluates patent value and explores its influencing factors using the network centrality and network position. This study utilizes a logistic regression model to explore the relationships in the LED industry between patent value and network centrality as measured from out-degree centrality, in-degree centrality, in-closeness centrality, and network position, which is measured from effect size. The empirical result shows that out-degree centrality and in-degree centrality have significant positive effects on patent value and that effect size has a significant negative effect on patent value.