Single-shot super-resolution total internal reflection fluorescence microscopy.

Guo, Min; Chandris, Panagiotis; Giannini, John Paul; Trexler, Adam J; Fischer, Robert; Chen, Jiji; Vishwasrao, Harshad D; Rey-Suarez, Ivan et al. · Nat Methods · 2018

basic_science · Level V

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Abstract

We combined instant structured illumination microscopy (iSIM) with total internal reflection fluorescence microscopy (TIRFM) in an approach referred to as instant TIRF-SIM, thereby improving the lateral spatial resolution of TIRFM to 115 ± 13 nm without compromising speed, and enabling imaging frame rates up to 100 Hz over hundreds of time points. We applied instant TIRF-SIM to multiple live samples and achieved rapid, high-contrast super-resolution imaging close to the coverslip surface.

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