Coarsening dynamics in the Swift-Hohenberg equation with an external field.

Abstract

We study the Swift-Hohenberg equation (SHE) in the presence of an external field. The application of the field leads to a phase diagram with three phases, i.e., stripe, hexagon, and uniform. We focus on coarsening after a quench from the uniform to stripe or hexagon regions. For stripe patterns, we find that the length scale associated with the order-parameter structure factor has the same growth exponent (≃1/4) as for the SHE with zero field. The growth process is slower in the case of hexagonal patterns, with the effective growth exponent varying between 1/6 and 1/9, depending on the quench parameters. For deep quenches in the hexagonal phase, the growth process stops at late stages when defect boundaries become pinned.