Deep learning enables structured illumination microscopy with low light levels and enhanced speed.

Jin, Luhong; Liu, Bei; Zhao, Fenqiang; Hahn, Stephen; Dong, Bowei; Song, Ruiyan; Elston, Timothy C; Xu, Yingke et al. · Nat Commun · 2020

basic_science · Level V

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Abstract

Structured illumination microscopy (SIM) surpasses the optical diffraction limit and offers a two-fold enhancement in resolution over diffraction limited microscopy. However, it requires both intense illumination and multiple acquisitions to produce a single high-resolution image. Using deep learning to augment SIM, we obtain a five-fold reduction in the number of raw images required for super-resolution SIM, and generate images under extreme low light conditions (at least 100× fewer photons). We validate the performance of deep neural networks on different cellular structures and achieve multi-color, live-cell super-resolution imaging with greatly reduced photobleaching.

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