Atomic Resolution Imaging of CrBr<sub>3</sub> Using Adhesion-Enhanced Grids.
basic_science · Level V
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- Record sourced from PubMed, PMID 32786938.
- Also identified by DOI 10.1021/acs.nanolett.0c02346.
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Abstract
Suspended specimens of 2D crystals and their heterostructures are required for a range of studies including transmission electron microscopy (TEM), optical transmission experiments, and nanomechanical testing. However, investigating the properties of laterally small 2D crystal specimens, including twisted bilayers and air-sensitive materials, has been held back by the difficulty of fabricating the necessary clean suspended samples. Here we present a scalable solution that allows clean free-standing specimens to be realized with 100% yield by dry-stamping atomically thin 2D stacks onto a specially developed adhesion-enhanced support grid. Using this new capability, we demonstrate atomic resolution imaging of defect structures in atomically thin CrBr<sub>3</sub>, a novel magnetic material that degrades in ambient conditions.