Annihilation trajectory of defects in smectic-C films.

Abstract

In a two-dimensional liquid crystal, each topological defect has a topological charge and a characteristic orientation and hence can be regarded as an oriented particle. Theories predict that the trajectories of annihilating defects depend on their relative orientation. Recently, these predictions have been tested in experiments on smectic-C films. Those experiments find curved trajectories that are similar to the predictions, but the detailed relationship between the defect orientations and the far-field director is different. To understand this difference, we extend the previous theories by adding the effects of elastic anisotropy and find that it significantly changes the curved trajectories.