Record-Low Subthreshold-Swing Negative-Capacitance 2D Field-Effect Transistors.
basic_science · Level V
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- Record sourced from PubMed, PMID 33043512.
- Also identified by DOI 10.1002/adma.202005353.
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Abstract
Power consumption is one of the most challenging bottlenecks for complementary metal-oxide-semiconductor integration. Negative-capacitance field-effect transistors (NC-FETs) offer a promising platform to break the thermionic limit defined by the Boltzmann tyranny and architect energy-efficient devices. However, it is a great challenge to achieving ultralow-subthreshold-swing (SS) (10 mV dec<sup>-1</sup> ) and small-hysteresis NC-FETs simultaneously at room temperature, which has only been reported using the hafnium zirconium oxide system. Here, based on a ferroelectric LiNbO<sub>3</sub> thin film with great spontaneous polarization, an ultralow-SS NC-FET with small hysteresis is designed. The LiNbO<sub>3</sub> NC-FET platform exhibits a record-low SS of 4.97 mV dec<sup>-1</sup> with great repeatability due to the superior capacitance matching characteristic as evidenced by the negative differential resistance phenomenon. By modulating the structure and operating parameters (such as channel length (L<sub>ch</sub> ), drain-sourse bias (V<sub>ds</sub> ), and gate bias (V<sub>g</sub> )) of devices, an optimized SS from ≈40 to ≈10 mV dec<sup>-1</sup> and hysteresis from ≈900 to ≈60 mV are achieved simultaneously. The results provide a new potential method for future highly integrated electronic and optical integrated energy-efficient devices.