Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices.
Where this comes from
- Record sourced from PubMed, PMID 33173041.
- Also identified by DOI 10.1038/s41467-020-19053-9 and PMC identifier 7655834.
- Licence recorded as CC BY.
- The licence permits redistribution, so the abstract is shown in full and the full text is available from the publisher.
Abstract
The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.