Exciton-phonon coupling strength in single-layer MoSe<sub>2</sub> at room temperature.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 33574235.
- Also identified by DOI 10.1038/s41467-021-20895-0 and PMC identifier 7878916.
- Licence recorded as CC BY.
- The licence permits redistribution, so the abstract is shown in full and the full text is available from the publisher.
Abstract
Single-layer transition metal dichalcogenides are at the center of an ever increasing research effort both in terms of fundamental physics and applications. Exciton-phonon coupling plays a key role in determining the (opto)electronic properties of these materials. However, the exciton-phonon coupling strength has not been measured at room temperature. Here, we use two-dimensional micro-spectroscopy to determine exciton-phonon coupling of single-layer MoSe<sub>2</sub>. We detect beating signals as a function of waiting time induced by the coupling between A excitons and A'<sub>1</sub> optical phonons. Analysis of beating maps combined with simulations provides the exciton-phonon coupling. We get a Huang-Rhys factor ~1, larger than in most other inorganic semiconductor nanostructures. Our technique offers a unique tool to measure exciton-phonon coupling also in other heterogeneous semiconducting systems, with a spatial resolution ~260 nm, and provides design-relevant parameters for the development of optoelectronic devices.