Self-clocking fast and variation tolerant true random number generator based on a stochastic mott memristor.

Kim, Gwangmin; In, Jae Hyun; Kim, Young Seok; Rhee, Hakseung; Park, Woojoon; Song, Hanchan; Park, Juseong; Kim, Kyung Min · Nat Commun · 2021

basic_science · Level V

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Abstract

The intrinsic stochasticity of the memristor can be used to generate true random numbers, essential for non-decryptable hardware-based security devices. Here, we propose a novel and advanced method to generate true random numbers utilizing the stochastic oscillation behavior of a NbO<sub>x</sub> mott memristor, exhibiting self-clocking, fast and variation tolerant characteristics. The random number generation rate of the device can be at least 40 kb s<sup>-1</sup>, which is the fastest record compared with previous volatile memristor-based TRNG devices. Also, its dimensionless operating principle provides high tolerance against both ambient temperature variation and device-to-device variation, enabling robust security hardware applicable in harsh environments.