Microscopic Evidence for Spatially Inhomogeneous Charge Trapping in Pentacene.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 34412424.
- Also identified by DOI 10.1002/adma.200401174.
- No licence information is recorded for this record.
- Because redistribution is not established, this page shows the abstract only. Follow the links below for the full text.
Abstract
Charge traps in pentacene thin-film transistors (Figure, left) have been imaged using electric force microscopy. The Figure shows a map of the trap distribution just below (middle) and well above (right) the transistor threshold voltage. It is found that the long-lived charge traps in polycrystalline pentacene are distributed inhomogeneously and do not appear to be associated with grain boundaries, as is generally assumed.