Probability of survival and stress distribution of narrow diameter implants with different implant-abutment taper angles.

Abstract

This study evaluated the probability of survival, failure mode, and stress distribution of narrow diameter implants (NDIs) with internal implant-abutment conical connection comprised of different taper angles and thread designs. Sixty-three NDIs (Ø 3.5 × 8.5 mm) were divided according to the taper angle (TA), internal diameter (ID), and trapezoidal thread design (TD) (n = 21/group), as follows: (a) 11.5°U (11.5° TA; ID: 2.5 mm; TD: dual threaded); (b) 11.5°S (11.5° TA; ID: 2.5 mm; TD: single threaded); (c) 16°S (16° TA; ID: 2.72 mm; TD: single threaded). They were subjected to step-stress accelerated life testing. The reliability and use-level probability Weibull curves were calculated at 50, 100, and 150 N for a mission of 100,000 cycles and the failure mode was analyzed using a scanning electron microscope. For finite element analysis the von-Mises stress (σ_vM ) was calculated for the abutment and implant. All groups showed high reliability (above 84%) and failures occurred predominantly in the abutment. In the FEA, 11.5°U showed higher σ_vM for the implant. All NDIs showed high reliability at clinically challenging loads. The system with greater taper angle showed lower σ_Vm in the implant, and dual threaded implants showed a higher stress concentration in the implant and cortical bone.