Ultrahigh Gain Solar Blind Avalanche Photodetector Using an Amorphous Ga<sub>2</sub>O<sub>3</sub>-Based Heterojunction.
basic_science · Level V
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- Record sourced from PubMed, PMID 34605627.
- Also identified by DOI 10.1021/acsnano.1c06567.
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Abstract
Solar blind photodetectors with a cutoff wavelength within the 200-280 nm region is attracting much attention due to their potential civilian and military applications. The avalanche photodetectors (APDs) formed based on wide-bandgap semiconductor Ga<sub>2</sub>O<sub>3</sub> are expected to meet emerging technological demands. These devices, however, suffer from limitations associated with the quality of as-grown Ga<sub>2</sub>O<sub>3</sub> or the difficulty in alleviating the defects and dislocations. Herein, high-performance APDs incorporating amorphous Ga<sub>2</sub>O<sub>3</sub> (a-Ga<sub>2</sub>O<sub>3</sub>)/ITO heterojunction as the central element have been reliably fabricated at room temperature. The a-Ga<sub>2</sub>O<sub>3</sub>-based APDs exhibits an ultrahigh responsivity of 5.9 × 10<sup>4</sup> A/W, specific detectivity of 1.8 × 10<sup>14</sup> Jones, and an external quantum efficiency up to 2.9 × 10<sup>7</sup>% under 254 nm light irradiation at 40 V reverse bias. Notably, the gain could reach 6.8 × 10<sup>4</sup>, indicating the outstanding capability for ultraweak signals detection. The comprehensive superior capabilities of the a-Ga<sub>2</sub>O<sub>3</sub>-based APDs can be ascribed to the intrinsic carrier transport manners in a-Ga<sub>2</sub>O<sub>3</sub> as well as the modified band alignment at the heterojunctions. The trade-off between low processing temperature and superior characteristics of a-Ga<sub>2</sub>O<sub>3</sub> promises greater design freedom for realization of wide applications of emerging semiconductor Ga<sub>2</sub>O<sub>3</sub> with even better performance since relieving the burden on the integration progress.