Oriented 2D Perovskite Wafers for Anisotropic X-ray Detection through a Fast Tableting Strategy.
basic_science · Level V
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- Record sourced from PubMed, PMID 34865244.
- Also identified by DOI 10.1002/adma.202108020.
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Abstract
2D perovskite single crystals have emerged as excellent optoelectronic materials owing to their unique anisotropic properties. However, growing large 2D perovskite single crystals remains challenging and time-consuming. Here, a new composition of lead-free 2D perovskite-4-fluorophenethylammonium bismuth iodide [(F-PEA)<sub>3</sub> BiI<sub>6</sub> ] is reported. An oriented bulk 2D wafer with a large area of 1.33 cm<sup>2</sup> is obtained by tableting disordered 2D perovskite powders, resulting in anisotropic resistivities of 5 × 10<sup>10</sup> and 2 × 10<sup>11</sup> Ω cm in the lateral and vertical directions, respectively. Trivalent Bi<sup>3+</sup> ions are employed to achieve a stronger ionic bonding energy with I<sup>-</sup> ions, which intrinsically suppress the ion-migration effect. Thus, the oriented wafer presents good capabilities in both charge collection and ion-migration suppression under a large applied bias along the out-of-plane direction, making it suitable for low-dosage X-ray detection. The large-area wafer shows a sensitive response to hard X-rays operated at a tube voltage of 120 kV<sub>p</sub> with the lowest detectable dose rate of 30 nGy s<sup>-1</sup> . Thus, the fast tableting process is a facile and effective strategy to synthesize large-area, oriented 2D wafers, showing excellent X-ray detection performance and operational stability that are comparable to those of 2D perovskite single crystals.