Nanomechanical Spectroscopy of 2D Materials.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 36252952.
- Also identified by DOI 10.1021/acs.nanolett.2c01289 and PMC identifier 9615986.
- Licence recorded as CC BY-NC-ND.
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Abstract
We introduce a nanomechanical platform for fast and sensitive measurements of the spectrally resolved optical dielectric function of 2D materials. At the heart of our approach is a suspended 2D material integrated into a high <i>Q</i> silicon nitride nanomechanical resonator illuminated by a wavelength-tunable laser source. From the heating-related frequency shift of the resonator as well as its optical reflection measured as a function of photon energy, we obtain the real and imaginary parts of the dielectric function. Our measurements are unaffected by substrate-related screening and do not require any assumptions on the underling optical constants. This fast (τ<sub>rise</sub> ∼ 135 ns), sensitive (noise-equivalent power = <math xmlns="http://www.w3.org/1998/Math/MathML"><mn>90</mn><mo></mo><mfrac><mrow><mi>pW</mi></mrow><mrow><mo>√</mo><mi>Hz</mi></mrow></mfrac></math>), and broadband (1.2-3.1 eV, extendable to UV-THz) method provides an attractive alternative to spectroscopic or ellipsometric characterization techniques.