Zinc-Contained Alloy as a Robustly Adhered Interfacial Lattice Locking Layer for Planar and Stable Zinc Electrodeposition.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 36841926.
- Also identified by DOI 10.1002/adma.202211961.
- No licence information is recorded for this record.
- Because redistribution is not established, this page shows the abstract only. Follow the links below for the full text.
Abstract
Stable zinc (Zn)/electrolyte interface is critical for developing rechargeable aqueous Zn-metal batteries with long-term stability, which requires the dense and stable Zn electrodeposition. Herein, an interfacial lattice locking (ILL) layer is constructed via the electro-codeposition of Zn and Cu onto the Zn electrodes. The ILL layer shows a low lattice misfit (δ = 0.036) with Zn(002) plane and selectively locks the lattice orientation of Zn deposits, enabling the epitaxial growth of Zn deposits layer by layer. Benefiting from the unique orientation-guiding and robustly adhered properties, the ILL layer enables the symmetric Zn||Zn cells to achieve an ultralong life span of >6000 h at 1 mA cm<sup>-2</sup> and 1 mAh cm<sup>-2</sup> , a low overpotential (65 mV) at 10 mAh cm<sup>-2</sup> , and a stable Zn plating/stripping for >90 h at an ultrahigh Zn depth of discharge (≈85%). Even with a limited Zn supply and a high current density (8.58 mA cm<sup>-2</sup> ), the ILL@Zn||Ni-doped MnO<sub>2</sub> cells can still survive for >2300 cycles.