Hybrid Integration of GaP Photonic Crystal Cavities with Silicon-Vacancy Centers in Diamond by Stamp-Transfer.
basic_science · Level V
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- Record sourced from PubMed, PMID 37096913.
- Also identified by DOI 10.1021/acs.nanolett.2c04890.
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Abstract
Optically addressable solid-state defects are emerging as some of the most promising qubit platforms for quantum networks. Maximizing photon-defect interaction by nanophotonic cavity coupling is key to network efficiency. We demonstrate fabrication of gallium phosphide 1-D photonic crystal waveguide cavities on a silicon oxide carrier and subsequent integration with implanted silicon-vacancy (SiV) centers in diamond using a stamp-transfer technique. The stamping process avoids diamond etching and allows fine-tuning of the cavities prior to integration. After transfer to diamond, we measure cavity quality factors (<i>Q</i>) of up to 8900 and perform resonant excitation of single SiV centers coupled to these cavities. For a cavity with a <i>Q</i> of 4100, we observe a 3-fold lifetime reduction on-resonance, corresponding to a maximum potential cooperativity of <i>C</i> = 2. These results indicate promise for high photon-defect interaction in a platform which avoids fabrication of the quantum defect host crystal.