Ultimate Limit in Optoelectronic Performances of Monolayer WSe<sub>2</sub> Sloping-Channel Transistors.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 37432041.
- Also identified by DOI 10.1021/acs.nanolett.3c01866.
- No licence information is recorded for this record.
- Because redistribution is not established, this page shows the abstract only. Follow the links below for the full text.
Abstract
Atomically thin monolayer two-dimensional (2D) semiconductors with natural immunity to short channel effects are promising candidates for sub-10 nm very large-scale integration technologies. Herein, the ultimate limit in optoelectronic performances of monolayer WSe<sub>2</sub> field-effect transistors (FETs) is examined by constructing a sloping channel down to 6 nm. Using a simple scaling method compatible with current micro/nanofabrication technologies, we achieve a record high saturation current up to 1.3 mA/μm at room temperature, surpassing any reported monolayer 2D semiconductor transistors. Meanwhile, quasi-ballistic transport in WSe<sub>2</sub> FETs is first demonstrated; the extracted high saturation velocity of 4.2 × 10<sup>6</sup> cm/s makes it suitable for extremely sensitive photodetectors. Furthermore, the photoresponse speed can be improved by reducing channel length due to an electric field-assisted detrapping process of photogenerated carriers in localized states. As a result, the sloping-channel device exhibits a faster response, higher detectivity, and additional polarization resolution ability compared to planar micrometer-scale devices.