Nonvolatile Memristive Effect in Few-Layer CrI<sub>3</sub> Driven by Electrostatic Gating.
basic_science · Level V
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- Record sourced from PubMed, PMID 38079362.
- Also identified by DOI 10.1021/acs.nanolett.3c03926.
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Abstract
The potential of memristive devices for applications in nonvolatile memory and neuromorphic computing has sparked considerable interest, particularly in exploring memristive effects in two-dimensional (2D) magnetic materials. However, the progress in developing nonvolatile, magnetic field-free memristive devices using 2D magnets has been limited. In this work, we report an electrostatic-gating-induced nonvolatile memristive effect in CrI<sub>3</sub>-based tunnel junctions. The few-layer CrI<sub>3</sub>-based tunnel junction manifests notable hysteresis in its tunneling resistance as a function of gate voltage. We further engineered a nonvolatile memristor using the CrI<sub>3</sub> tunneling junction with low writing power and at zero magnetic field. We show that the hysteretic transport observed is not a result of trivial effects or inherent magnetic properties of CrI<sub>3</sub>. We propose a potential association between the memristive effect and the newly predicted ferroelectricity in CrI<sub>3</sub> via gating-induced Jahn-Teller distortion. Our work illuminates the potential of 2D magnets in developing next-generation advanced computing technologies.